Daksh

Seeing and measuring the impossible

VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.

Critical Dimensional Measurement Systems

Pinnacle Plus

Ultra-high accuracy dimensional metrology system.

Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/

State-of-the-art linear motion control technology provides the fastest, most reliable platform available for high capacity operation in production environments ranging.

Key Features and Options

Pinnacle+ Plus' state-of-the-art linear motion control technology provides the fastest, most reliable platform available for high volume, high capacity operation in production environments ranging from clean rooms to factory floors.

The Pinnacle+ Plus operates with one or more of VIEW's standard metrology software packages

  • VIEW Metrology Software (VMS™) which offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.
Standard Optional
X,Y,Z Travel 250x150x100 mm
Load Capacity 25 kg
Imaging Optics Single magnification, fixed lens optics with factory configurable back tube (1X standard) and field interchangeable front lens options (5X standard).
Metrology Camera 2.0 megapixel, 1/2 inch, digital monochrome 5.0 megapixel, 1/2 inch, digital, monochrome 2.0 megapixel 1/2 inch, digital monochrome
Illumination All LED coaxial through-the-lens surface light and below-the-stage back light Multi-color programmable ring light Grid autofocus system
Sensor Options Through-the-lens (TTL) laser Spectra Probe white light range sensor Off-axis triangulation laser
Measurement Modes High Speed Move and Measure (MAM) Continuous Image Capture (CIC)