VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/
State-of-the-art linear motion control technology provides the fastest, most reliable platform available for high capacity operation in production environments ranging.
Pinnacle+ Plus' state-of-the-art linear motion control technology provides the fastest, most reliable platform available for high volume, high capacity operation in production environments ranging from clean rooms to factory floors.
The Pinnacle+ Plus operates with one or more of VIEW's standard metrology software packages
Standard | Optional | |
---|---|---|
X,Y,Z Travel | 250x150x100 mm | |
Load Capacity | 25 kg | |
Imaging Optics | Single magnification, fixed lens optics with factory configurable back tube (1X standard) and field interchangeable front lens options (5X standard). | |
Metrology Camera | 2.0 megapixel, 1/2 inch, digital monochrome | 5.0 megapixel, 1/2 inch, digital, monochrome 2.0 megapixel 1/2 inch, digital monochrome |
Illumination | All LED coaxial through-the-lens surface light and below-the-stage back light | Multi-color programmable ring light Grid autofocus system |
Sensor Options | Through-the-lens (TTL) laser Spectra Probe white light range sensor Off-axis triangulation laser | |
Measurement Modes | High Speed Move and Measure (MAM) | Continuous Image Capture (CIC) |